September 5 – 10 , 2004, Dagstuhl Seminar 04371

Perspectives of Model-Based Testing

Participants

  • Axel Belinfante (University of Twente, NL)
  • Henrik Bohnenkamp (University of Twente, NL)
  • Laura Brandán Briones (University of Twente, NL)
  • Ed Brinksma (Embedded Systems Institute – Eindhoven, NL)
  • Simon Burton (Daimler AG – Sindelfingen, DE)
  • Colin Campbell (Microsoft Research – Redmond, US)
  • Mirko Conrad (Daimler Research – Berlin, DE)
  • René de Vries (Radboud University Nijmegen, NL)
  • Winfried Dulz (Universität Erlangen-Nürnberg, DE)
  • Bernd Finkbeiner (Universität des Saarlandes, DE)
  • Lars Frantzen (Radboud University Nijmegen, NL)
  • Marie-Claude Gaudel (Université Paris Sud, FR)
  • Wolfgang Grieskamp (Microsoft Research – Redmond, US)
  • Yuri Gurevich (Microsoft Research – Redmond, US)
  • Alan Hartman (IBM – Haifa, IL)
  • Jiale Huo (McGill University, CA)
  • Sarfraz Khurshid (University of Texas – Austin, US)
  • Pieter Koopman (Radboud University Nijmegen, NL)
  • Victor Kuliamin (Academy of Sciences – Moscow, RU)
  • Mass Soldal Lund (University of Oslo, NO)
  • Brian Nielsen (Aalborg University, DK)
  • Doron A. Peled (University of Warwick – Coventry, GB)
  • Alexandre Petrenko (CRIM – Montreal, CA)
  • Stacy Prowell (University of Tennessee, US)
  • Yves-Marie Quemener (France Télécom R&D – Lanion, FR)
  • John Rushby (SRI – Menlo Park, US)
  • Vlad Rusu (CAPS entreprise – Rennes, FR)
  • Holger Schlingloff (Fraunhofer Institut – Berlin, DE)
  • Dirk Seifert (TU Berlin, DE)
  • Dehla Sokenou (TU Berlin, DE)
  • Marielle Stoelinga (University of Twente, NL)
  • Nikolai Tillmann (Microsoft Research – Redmond, US)
  • Jan Tretmans (Radboud University Nijmegen, NL)
  • Aliki Tsiolakis (Universität Bremen, DE)
  • Andreas Ulrich (Siemens AG – München, DE)
  • Machiel van der Bijl (University of Twente, NL)
  • Margus Veanes (Microsoft Research – Redmond, US)
  • Burkhart Wolff (ETH Zürich, CH)