Computer Aided Design and Test

Summary

The second workshop on "Computer Aided Design and Test" at the IFBI was organized by Bernd Becker (Frankfurt), Randal E. Bryant (Carnegie Mellon) and Christoph Meinel (Trier). There were 36 participants from 5 countries. The organizers took the chance to bring together research groups from different areas in computer science, electrical engineering and industry. The common interest of all participants were problems related to the field of electronic design automation with special emphasis on research done in the area of (high level and logic) synthesis, verification and testing.

Twenty-three lectures were presented at the workshop covering the following topics:

• High level synthesis and timing
• Verification and timing
• OBDDs and OBDD-based algorithms
• generalizations of OBDDs
• Delay fault testing and synthesis
• Testable (fault tolerant) design
• Random testability
• Fault simulation and test generation

The participants are very grateful for this opportunity to meet in such an excellent atmosphere that provided ample time for fruitful discussions, be it on new ideas and future developments, or on the differing viewpoints of e.g. a practitioner and a theoretical computer scientist.